Geometry-Dependent Quality Factors in Ba0:5Sr0:5TiO3 Parallel-Plate Capacitors
نویسنده
چکیده
Quality factor variation with top electrode area in thin-film barium–strontium–titanate parallel-plate capacitors is discussed. At low frequencies, the geometry dependence is consistent with the presence of a parallel parasitic loss pathway enabled by conduction over the device mesa surface. At high frequencies, the variation in the quality factor with top electrode area is due to a geometry-independent series resistance.
منابع مشابه
Improved Figure of Merit of (Ba,Sr)TiO3-Based Ceramics by Sn Substitution
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